Capping Intercrystalline Defects of Polycrystalline UiO-66 Membranes by Polydimethylsiloxane Coating
Vol. 29, No. 1, pp. 71-75, Mar. 2023
10.7464/ksct.2023.29.1.71
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Polycrystalline membrane Intercrystalline defect plugging Polymer coating Metal-organic Framework UiO-66
Abstract
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Cite this article
[IEEE Style]
I. J. Kim and H. T. Kwon, "Capping Intercrystalline Defects of Polycrystalline UiO-66 Membranes by Polydimethylsiloxane Coating," Clean Technology, vol. 29, no. 1, pp. 71-75, 2023. DOI: 10.7464/ksct.2023.29.1.71.
[ACM Style]
Ik Ji Kim and Hyuk Taek Kwon. 2023. Capping Intercrystalline Defects of Polycrystalline UiO-66 Membranes by Polydimethylsiloxane Coating. Clean Technology, 29, 1, (2023), 71-75. DOI: 10.7464/ksct.2023.29.1.71.